| 发明名称 |
POLARIZATION DEPENDENCY MEASURING METHOD AND DEVICE OF 2-LIGHT FLUX INTERFEROMETER |
| 摘要 |
PROBLEM TO BE SOLVED: To measure the maximum value of a shift of peak wavelength of interference intensity accompanying polarization variation and the worst value of extinction ratio deterioration accompanying the polarization variation. SOLUTION: At least any one of low loss side immobilization points (F<SB>H</SB>and R<SB>H</SB>) or large loss side immobilization points (F<SB>L</SB>and R<SB>L</SB>) is found from intersection of N kinds of normal loss spectra. The worst value of an extinction ratio is R<SB>H</SB>/R<SB>L</SB>. FSR=(F<SB>H</SB>-F<SB>L</SB>)×2 is found from adjacent F<SB>H</SB>and F<SB>L</SB>. The worst value of a shift amount of a peak is 2×ΔF=FSR×Δθ/π. Polarization dependency of optical characteristics of DUT is obtained by using the above nature. COPYRIGHT: (C)2007,JPO&INPIT
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| 申请公布号 |
JP2007040977(A) |
申请公布日期 |
2007.02.15 |
| 申请号 |
JP20060143796 |
申请日期 |
2006.05.24 |
| 申请人 |
NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
KAWAKAMI HIROTO;SATO NORIFUMI;MIYAMOTO YUTAKA |
| 分类号 |
G01M11/00;G01J4/04 |
主分类号 |
G01M11/00 |
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