发明名称 After deposition method of thinning film to reduce pinhole defects
摘要 A method of forming a thin film is provided in which a film having a first thickness is deposited over a substrate, wherein the first thickness is greater than a thickness at which the initially deposited film begins to dewet from the substrate. The initially deposited film is then stabilized to form a stabilized film. Thereafter, the stabilized film is then thinned to a second thickness, such that the resulting film now has a smaller thickness than the thickness at which the initially deposited film would begin to dewet from the substrate. However, as a result of the prior stabilization, the reduced thickness film remains free of dewetting defects.
申请公布号 US2007037325(A1) 申请公布日期 2007.02.15
申请号 US20060581544 申请日期 2006.10.16
申请人 LI WAI-KIN;BRODSKY COLIN J;SCHEER STEVEN A 发明人 LI WAI-KIN;BRODSKY COLIN J.;SCHEER STEVEN A.
分类号 H01L21/84 主分类号 H01L21/84
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