发明名称 METHOD FOR INSPECTION PLAN IN MAGNETIC RESONANCE EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a method enhancing the speed of an inspection plan when planning the inspection by a profile image composed from at least two individual images. SOLUTION: This method for the inspection plan of an inspection object in magnetic resonance equipment performed on a composition profile image composed from at least two individual images has following steps. (a) Imaging of a first part of the profile image, (b) provision of the first part of the profile image for a further measurement plan to an operator of the magnetic resonance equipment, (c) imaging of the second part of the profile image, (d) combination of the first and second parts of the profile image, and (e) provision of the combined first and second parts of the profile image for the further measurement plan. In this case, the step (b) is executed before the step (e). COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007038012(A) 申请公布日期 2007.02.15
申请号 JP20060212258 申请日期 2006.08.03
申请人 SIEMENS AG 发明人 BECK WALTER;MAIER CLAUS;MOHR CECILE;ZELTNER JOCHEN
分类号 A61B5/055;G01R33/32 主分类号 A61B5/055
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