发明名称 Methods and apparatus for selectively removing conductive material from a microelectronic substrate
摘要 Methods and apparatuses for selectively removing conductive materials from a microelectronic substrate. A method in accordance with an embodiment of the invention includes positioning the microelectronic substrate proximate to and spaced apart from an electrode pair that includes a first electrode and a second electrode spaced apart from the first electrode. An electrolytic liquid can be directed through a first flow passage to an interface region between the microelectronic substrate and the electrode pair. A varying electrical signal can be passed through the electrode pair and the electrolytic liquid to remove conductive material from the microelectronic substrate. The electrolytic liquid can be removed through a second flow passage proximate to the first flow passage and the electrode pair.
申请公布号 US2007037490(A1) 申请公布日期 2007.02.15
申请号 US20060585740 申请日期 2006.10.23
申请人 MICRON TECHNOLOGY, INC. 发明人 LEE WHONCHEE;MOORE SCOTT E.;MEIKLE SCOTT G.
分类号 B24B1/00;B23H5/08;B24B7/19;B24B49/00;B24B51/00 主分类号 B24B1/00
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