METHOD FOR DETERMINING THE DISTRIBUTION OF DISCONTINUITIES IN THE STRUCTURE OF A CRYSTAL

摘要

The proposed method for determining the distribution of discontinuities in the structure of a crystal consists in exposing the crystal to monochromatic optical radiation, determining the dependence of the permittivity (?1) and the dielectric loss coefficient (?2) of the crystal sample on the coordinate (x) of the radiation source relative to the sample, determining the rates of the change of the permittivity and the dielectric loss coefficient of the sample and characteristics d?1/dx = f(x) and d?2/dx = f(x), determining the coordinates of the areas that differ in value and sign of accumulated electric charges and charges that affect dielectric loss, plotting diagrams d?1/dx = f(?1) and d?2/dx = f(?2), and determining the limits and areas of the discontinuities from the said diagrams.