发明名称 Semiconductor device and method for manufacturing the same
摘要 It is possible to prevent the deterioration of device characteristic as much as possible. A semiconductor device includes: a semiconductor substrate; a gate insulating film provided above the semiconductor substrate and containing a metal, oxygen and an additive element; a gate electrode provided above the gate insulating film; and source/drain regions provided in the semiconductor substrate on both sides of the gate electrode. The additive element is at least one element selected from elements of Group 5, 6, 15, and 16 at a concentration of 0.003 atomic % or more but 3 atomic % or less.
申请公布号 US2007034902(A1) 申请公布日期 2007.02.15
申请号 US20060373140 申请日期 2006.03.13
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KAMIMUTA YUUICHI;NISHIYAMA AKIRA;NAKASAKI YASUSHI;INO TSUNEHIRO;KOYAMA MASATO
分类号 H01L31/00 主分类号 H01L31/00
代理机构 代理人
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