<p>A device for inspecting a flaw at an end section has an elliptic mirror having inside a mirror surface and having at its vertex a cutout into which an object to be inspected is insertable; a light emission section for applying coherent light to an end section of the object placed at a position near a first focal point of the elliptic mirror; a light detection section placed at a second focal point of the elliptic mirror; and a light shielding means for shielding regularly reflected diffraction light of low order. The light emission section can apply coherent light of different wavelengths.</p>
