发明名称 DEPOSITING APPARATUS AND METHOD
摘要 PROBLEM TO BE SOLVED: To control, in an increase of a Pb composition ratio due to adhesion of revaporized Pb from a deposition film on an adhesion prevention plate to a PZT film deposited on a substrate by sputtering, the Pb composition ratio in the foregoing deposition. SOLUTION: There is provided in a chamber of a sputtering apparatus a lower adhesion prevention plate fixed to a bottom wall via an insulator covering a pedestal side surface, and a chamber bottom wall on which a support table for placing the substrate is mounted, below the surface of the substrate. The lower adhesion prevention plate is made applicable in electric potential. The Pb composition ratio in the deposited PZT is controlled by controlling the applied electric potential. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007042818(A) 申请公布日期 2007.02.15
申请号 JP20050224624 申请日期 2005.08.02
申请人 FUJITSU LTD 发明人 NAKAMURA WATARU
分类号 H01L21/31;C23C14/00;H01L21/316;H01L21/8246;H01L27/105 主分类号 H01L21/31
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