发明名称 IC CONTACTOR FOR DEVICE UNDER TEST
摘要 PROBLEM TO BE SOLVED: To miniaturize the whole of an IC contactor while preventing deterioration from occurring in durability of a vertex part of a conductive slider to more stabilize contact resistance of a device under test to an electrode terminal. SOLUTION: This IC contactor 10 comprises: a conductive case 15; an elastomer 16 disposed in the conductive case 15; and the conductive slider 11, with its sliding stroke regulated, energized by the elastomer 16 toward the electrode terminal 8 side of the device 7 under test to make sliding contact with an inner surface of the conductive case 15 with the vertex part making pressing contact with the electrode terminal 8. The whole of the IC contactor 10 is somewhat laterally inclined relative to a vertical line P. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007040946(A) 申请公布日期 2007.02.15
申请号 JP20050248389 申请日期 2005.08.02
申请人 RF GIKEN KOGYO KK 发明人 TAMAMURA TOSHIO
分类号 G01R1/067;G01R1/073;G01R31/26 主分类号 G01R1/067
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