| 摘要 |
In certain aspects, the invention features interferometry systems that include an input assembly positioned to receive a beam emitted from a light source comprising a first component beam and a second component beam, the input assembly being configured to change a dimension of one of the component beams relative to the dimension of the other component beam, an interferometer positioned to receive the component beams propagating from the input assembly, the interferometer being configured to direct the component beams along different paths and to produce an output beam by directing the component beams along a common path, wherein the output beam comprises information about an optical path difference between the different component beam paths, and an output assembly positioned in the path of the output beam and configured to change a dimension of the component beam that contacts the measurement object.
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