发明名称 Electrostatic discharge protection circuit
摘要 <p>An electrostatic discharge protection circuit formed as an integrated circuit chip, the chip comprising: a first region of a first conductivity type; a second region of a second conductivity type adjoining a first surface of the chip, the second region forming a first PN junction diode with the first region; a third region of the second conductivity type separated from the second region and adjoining the first surface of the chip and enclosing a fourth region of the first conductivity type and a fifth region of the first conductivity type, the fourth and fifth regions adjoining the first surface, the fourth region forming a second PN junction diode with the third region and the fifth region forming a third PN junction diode with the third region; a sixth region of the first conductivity type and a seventh region of the second conductivity type, the sixth and seventh regions being separated from the second and third regions and adjoining the first surface, the sixth region forming a fourth PN junction diode with the seventh region; a first metal layer connecting the second and fourth regions; a second metal layer connecting the fifth and seventh regions; a third metal layer connecting the first and sixth regions; and a fourth metal layer for carrying an input signal and connecting the first metal layer to a circuit to be protected by the electrostatic discharge protection circuit.</p>
申请公布号 EP1753109(A2) 申请公布日期 2007.02.14
申请号 EP20060021653 申请日期 1999.01.04
申请人 SILICONIX INCORPORATED 发明人 WILLIAMS, RICHARD K.
分类号 H01L27/04;H02H9/04;G05F1/10;H01L21/822;H01L27/02;H01L27/06;H01L27/08;H01L27/12 主分类号 H01L27/04
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