| 摘要 |
A process for analysing a sample panel on which at least two material samples are arranged comprises measuring an impedance spectrum in respect of each of the material samples and storing the spectra in a database. Depending on the impedance spectrum measured a structure of an equivalent circuit is determined which comprises at least one electronic component. For an error-minimising computation, starting values for at least one component of the respective equivalent circuit are then determined. In the course of the error-minimising computation a theoretical impedance spectrum is computed in respect of at least one of the material samples, taking as a basis the impedance spectrum measured in respect of the material sample and also the starting value for the component of the equivalent circuit in question, and fit values for the components of the equivalent circuit in question are determined. Subsequently a validation quantity for the computed, theoretical impedance spectrum is determined and an evaluation quantity is ascertained by comparison of at least one fit value for the electronic component with a reference value. |
