发明名称 |
HIGHLY INTEGRATED SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
<p>A high integrated semiconductor device and its manufacturing method are provided to single-crystallize a crystal structure of a semiconductor material being formed through a deposition process by performing an epitaxial process. A first conductive layer pattern(115) and a first semiconductor pattern(125) are formed on a semiconductor substrate(100). The first conductive layer pattern and the first semiconductor pattern expose the semiconductor substrate and are stacked in turn. The first semiconductor pattern is a noncrystalline structure. A second semiconductor layer(130) is formed on the resultant structure where the first semiconductor pattern is formed. The second semiconductor layer is a noncrystalline structure and contacted to the semiconductor substrate. An epitaxial process is performed by using the semiconductor substrate as a seed layer to change crystalline conditions of the second semiconductor layer and the first semiconductor pattern into a noncrystalline condition.</p> |
申请公布号 |
KR100684889(B1) |
申请公布日期 |
2007.02.13 |
申请号 |
KR20050110004 |
申请日期 |
2005.11.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, SUNG MIN;YUN, EUN JUNG |
分类号 |
H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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