发明名称 HIGHLY INTEGRATED SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要 <p>A high integrated semiconductor device and its manufacturing method are provided to single-crystallize a crystal structure of a semiconductor material being formed through a deposition process by performing an epitaxial process. A first conductive layer pattern(115) and a first semiconductor pattern(125) are formed on a semiconductor substrate(100). The first conductive layer pattern and the first semiconductor pattern expose the semiconductor substrate and are stacked in turn. The first semiconductor pattern is a noncrystalline structure. A second semiconductor layer(130) is formed on the resultant structure where the first semiconductor pattern is formed. The second semiconductor layer is a noncrystalline structure and contacted to the semiconductor substrate. An epitaxial process is performed by using the semiconductor substrate as a seed layer to change crystalline conditions of the second semiconductor layer and the first semiconductor pattern into a noncrystalline condition.</p>
申请公布号 KR100684889(B1) 申请公布日期 2007.02.13
申请号 KR20050110004 申请日期 2005.11.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SUNG MIN;YUN, EUN JUNG
分类号 H01L27/115 主分类号 H01L27/115
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