发明名称 Multiple twin cell non-volatile memory array and logic block structure and method therefor
摘要 Extremely dense memory cell structures provide for new array structures useful for implementing memory and logic functions. An exemplary non-volatile memory array includes a first plurality of X-lines configured to be logically identical in a read mode of operation, and each associated with a first Y-line group numbering at least one Y-line. Each of the first plurality of X-lines may also be associated with a second Y-line group numbering at least one Y-line. In some embodiments, the first and second Y-Line groups are simultaneously selectable in a read mode and, when so selected, are respectively coupled to true and complement inputs of a sense amplifier circuit. Such Y-line groups may number only one Y-line, or may number more than one Y-line. Many types of memory cells may be used, such as various passive element cells and EEPROM cells, in both 2D or 3D memory arrays. Such arrays may be configured as a memory to store data, or configured to perform threshold logic, or configured as a content addressable memory array.
申请公布号 US7177183(B2) 申请公布日期 2007.02.13
申请号 US20030675212 申请日期 2003.09.30
申请人 SANDISK 3D LLC 发明人 SCHEUERLEIN ROY E.;FASOLI LUCA;JOHNSON MARK G.
分类号 G11C16/04;G11C8/10;G11C8/14;G11C11/34;G11C16/10;G11C16/16 主分类号 G11C16/04
代理机构 代理人
主权项
地址