| 摘要 |
A test apparatus has multiple instruments that are synchronized with respect to one another so that a trigger signal may be generated in response to events occurring at different instruments. The events may correspond to events defined within a test program or events detected at a device under test. A partial trigger signal is generated by each of the different instruments, and the partial trigger signals are used in generating the trigger signal. Different offset delays are applied to the partial trigger signals so that the partial trigger signals generated by the different instruments are synchronized with respect to each other.
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