发明名称 Identification of an integrated circuit from its physical manufacture parameters
摘要 The invention concerns an identification method and circuit ( 1 ) of the network type of parameters contained in an integrated circuit chip, comprising a single input terminal ( 2 ) for applying a signal (E) triggering an identification, the output terminals ( 3 <SUB>1</SUB> , 3 <SUB>2</SUB> , 3 <SUB>i-1</SUB> , 3 <SUB>i</SUB> , 3 <SUB>n-1</SUB> , 3 <SUB>n</SUB>) adapted to deliver a binary identifying code (B<SUB>1</SUB>, B<SUB>2</SUB>, B<SUB>i-1</SUB>, B<SUB>i</SUB>, B<SUB>n-1</SUB>, B<SUB>n</SUB>), first electrical paths P<SUB>1</SUB>, P<SUB>2</SUB>, P<SUB>i</SUB>, P<SUB>n</SUB>), individually connecting said input terminal to each output terminal, and means ( 4, 5 <SUB>1</SUB> , 5 <SUB>2</SUB> , 5 <SUB>i</SUB> , 5 <SUB>n</SUB>) for simultaneously integrating the binary states present in output of the electrical paths, each path inputting a delay sensitive to technological dispersions and/or of the integrated circuit fabrication method.
申请公布号 US7178113(B2) 申请公布日期 2007.02.13
申请号 US20040473058 申请日期 2004.02.06
申请人 STMICROELECTRONICS S.A. 发明人 BARDOUILLET MICHEL;WUIDART LUC
分类号 G01R31/28;G06F17/50;G11C5/00;G11C8/20;H01L21/822;H01L27/04;H03K5/15;H03K5/19;H03K19/173 主分类号 G01R31/28
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