发明名称 |
Phase change material, phase change random access memory including the same, and methods of manufacturing and operating the same |
摘要 |
A phase change material, a PRAM including the same, and methods of manufacturing and operating the same are provided. Insulating impurities may be uniformly distributed over an entire or partial region of the phase change material. The PRAM may include a phase change layer including the phase change material. The insulating impurity content of the phase change material may be 0.1 to 10% (inclusive) the volume of the phase change material. The insulating impurity content of the phase change material may be adjusted by controlling the power applied to a target including the insulating impurities.
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申请公布号 |
US2007029606(A1) |
申请公布日期 |
2007.02.08 |
申请号 |
US20060498796 |
申请日期 |
2006.08.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
NOH JIN-SEO;KHANG YOON-HO;LEE SANG-MOCK;SUH DONG-SEOK |
分类号 |
H01L29/788 |
主分类号 |
H01L29/788 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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