发明名称 PHASE CHANGE MEMORY CELL AND METHOD OF FORMATION
摘要 <p>A phase change memory element and methods for forming the same are provided. The memory element includes a first electrode (12) and a chalcogenide comprising phase change material layer (18) over the first electrode. A metal -chalcogenide layer (20) is over the phase change material layer. The metal chalcogenide layer is tin- telluride. A second electrode (24) is over the metal-chalcogenide layer. The memory element is configured to have reduced current requirements .</p>
申请公布号 WO2007016169(A1) 申请公布日期 2007.02.08
申请号 WO2006US29051 申请日期 2006.07.26
申请人 MICRON TECHNOLOGY, INC.;CAMPBELL, KRISTY, A. 发明人 CAMPBELL, KRISTY, A.
分类号 H01L45/00 主分类号 H01L45/00
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