发明名称 |
PHASE CHANGE MEMORY CELL AND METHOD OF FORMATION |
摘要 |
<p>A phase change memory element and methods for forming the same are provided. The memory element includes a first electrode (12) and a chalcogenide comprising phase change material layer (18) over the first electrode. A metal -chalcogenide layer (20) is over the phase change material layer. The metal chalcogenide layer is tin- telluride. A second electrode (24) is over the metal-chalcogenide layer. The memory element is configured to have reduced current requirements .</p> |
申请公布号 |
WO2007016169(A1) |
申请公布日期 |
2007.02.08 |
申请号 |
WO2006US29051 |
申请日期 |
2006.07.26 |
申请人 |
MICRON TECHNOLOGY, INC.;CAMPBELL, KRISTY, A. |
发明人 |
CAMPBELL, KRISTY, A. |
分类号 |
H01L45/00 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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