SEMICONDUCTOR INTEGRATED CIRCUIT AND MICROCOMPUTER

摘要

PROBLEM TO BE SOLVED: To attain characteristic evaluation for a non-volatile storage device in detail without impairing the real time performance of data processing due to the write erasure of the non-volatile storage device. SOLUTION: The semiconductor integrated circuit (1) is provided with non-volatile memory modules (4, 5) whose writing and erasure is available and a CPU (2). The non-volatile memory module is provided with a local CPU (12). This semiconductor integrated circuit (1) is provided with a first operation mode for validating writing and erasure control for the non-volatile memory module by the successive instruction execution of the CPU and a second operation mode for validating writing and erasure control by the successive instruction execution of the local CPU which responds to a command issued by the CPU. The writing and erasure for the non-volatile memory module is executed according to the control so that flexible control can be executed in both prototype evaluation and real operation. The CPU is able to execute the other processing during the processing of the local CPU so that the maintenance of real time performance can be executed. COPYRIGHT: (C)2007,JPO&INPIT