发明名称 Semiconductor memory device
摘要 A level shift element adjusting a voltage level at the time of selection of a word line according to fluctuations in threshold voltage of a memory cell transistor is arranged for each word line. This level shift element lowers a driver power supply voltage, and transmits the level-shifted voltage onto a selected word line. The level shift element can be replaced with a pull-down element for pulling down the word line voltage according to the threshold voltage level of the memory cell transistor. In either case, the selected word line voltage level can be adjusted according to the fluctuations in threshold voltage of the memory cell transistor without using another power supply system. Thus, the power supply circuitry is not complicated, and it is possible to achieve a semiconductor memory device that can stably read and write data even with a low power supply voltage.
申请公布号 US2007030741(A1) 申请公布日期 2007.02.08
申请号 US20060492031 申请日期 2006.07.25
申请人 RENESAS TECHNOLOGY CORP. 发明人 NII KOJI;OHBAYASHI SHIGEKI;TSUKAMOTO YASUMASA;YABUUCHI MAKOTO
分类号 G11C7/00 主分类号 G11C7/00
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