发明名称 Package Structure and Wafer Level Package Method
摘要 A wafer level package process includes: providing a device substrate, in which one surface of the device substrate includes a plurality of devices; providing a cap substrate and forming a plurality of cavities on one surface of the cap substrate, in which the location of each cavity is corresponding to the location of each device of the devices substrate; forming a protective cap in each cavity by utilizing the cavity as a mold; aligning each cavity of the cap substrate to each device of the device substrate and connecting the protective cap on the device substrate, such that each of the protective caps covers each device; and removing the cap substrate from the protective cap.
申请公布号 US2007029631(A1) 申请公布日期 2007.02.08
申请号 US20050275256 申请日期 2005.12.21
申请人 ADVANCED SEMICONDUCTOR ENGINEERING, INC. 发明人 WANG WEI-CHUNG
分类号 H01L23/02;H01L21/46 主分类号 H01L23/02
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