发明名称 LOW-REFLECTANCE PROCESSING METHOD OF SILICON SUBSTRATE FOR SOLAR CELLS AND SILICON SUBSTRATE FOR SOLAR CELL
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a low-reflectance processing method of a silicon substrate for solar cells and a silicon substrate for solar cells capable of reducing the reflective index by stably forming fine unevenness on the surface of the silicon substrate of a single crystal or polycrystal used for solar cells. <P>SOLUTION: There is provided a method of processing the surface of a silicon substrate A of a single crystal or polycrystal used for solar cells with a low reflective index, having a first step of applying a roughening processing on the surface of the silicon substrate A by performing a chemical or physical processing; a second step of performing a first plasma treatment on the surface of the roughened silicon substrate A by using oxygen gas under vacuum; and a third step of forming fine unevenness on the surface of the roughened silicon substrate A by performing a second plasma treatment by using halogen gas under vacuum on the surface of the silicon substrate A that undergone the first plasma treatment. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007036170(A) 申请公布日期 2007.02.08
申请号 JP20050311834 申请日期 2005.10.26
申请人 SHINRYO CORP 发明人 NAKAJIMA SADAHIRO;TAWARA MINORU;ASAHI YOSHIO;OTSUBO KOJI
分类号 H01L31/04 主分类号 H01L31/04
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