发明名称 Method and apparatus for forming silicon-containing insulating film
摘要 A silicon-containing insulating film is formed on a target substrate by CVD, in a process field to be selectively supplied with a purge gas, a first process gas containing a silane family gas, and a second process gas containing a gas selected from the group consisting of nitriding, oxynitriding, and oxidizing gases. This method alternately includes first to fourth steps. The first, second, third, and fourth steps perform supply of the first process gas, purge gas, second process gas, and purge gas, respectively, while stopping supply of the other two gases. The process field is continuously vacuum-exhausted over the first to fourth steps through an exhaust passage provided with an opening degree adjustment valve. An opening degree of the valve in the first step is set to be 5 to 95% of that used in the second and fourth steps.
申请公布号 US2007032047(A1) 申请公布日期 2007.02.08
申请号 US20060496436 申请日期 2006.08.01
申请人 HASEBE KAZUHIDE;OKADA MITSUHIRO;CHOU PAO-HWA;OGAWA JUN;KIM CHAEHO;FUKUSHIMA KOHEI;TAKAHASHI TOSHIKI;SATO JUN 发明人 HASEBE KAZUHIDE;OKADA MITSUHIRO;CHOU PAO-HWA;OGAWA JUN;KIM CHAEHO;FUKUSHIMA KOHEI;TAKAHASHI TOSHIKI;SATO JUN
分类号 C23C16/00;C23C16/44;G06F19/00;H01L21/20;H01L21/31 主分类号 C23C16/00
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