发明名称 SOLID-STATE IMAGING DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 PROBLEM TO BE SOLVED: To provide a solid-state imaging device in which, even when a photoelectric conversion device is disposed at an offset location in a pixel area, incident beams are certainly focused on the photoelectric conversion device to enhance its sensitivity. SOLUTION: A photosensitive transparent resin layer is laminated on a substrate having a surface laid out into a plurality of pixel areas, and arranged with the photoelectric conversion device in each of these pixel areas. After the photosensitive transparent resin layer is exposed and developed in a pattern shape, it is heated to form a convex microlens. Upon this formation, the pattern is formed such that it has a comparatively narrow width on the side of the photoelectric conversion device, and has a comparatively broad width on the opposite side. The surface is melted by heating to form the convex microlens in which a top P2 is at an offset location on the opposite side of the photoelectric conversion device. Also, its radius of curvature is great on the side of the photoelectric conversion device. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007035837(A) 申请公布日期 2007.02.08
申请号 JP20050215597 申请日期 2005.07.26
申请人 TOPPAN PRINTING CO LTD 发明人 FUKUYOSHI KENZO;ISHIMATSU TADASHI;NAKAO MITSUHIRO
分类号 H01L27/14;H04N5/335;H04N5/361 主分类号 H01L27/14
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