发明名称 Abnormal state determination method and apparatus
摘要 In an abnormal state determination method, the state of a first contact that is set to be open normally and closed in an operation is detected. The state of a second contact that is set to be closed normally and open in the operation complementarily to the first contact is detected. The detected states of the first and second contacts are compared, and abnormality is determined when the first and second contacts are in the same state. An abnormal state determination apparatus is also disclosed.
申请公布号 US2007030595(A1) 申请公布日期 2007.02.08
申请号 US20060499456 申请日期 2006.08.04
申请人 TSUKAMOTO YOZO 发明人 TSUKAMOTO YOZO
分类号 G11B5/82 主分类号 G11B5/82
代理机构 代理人
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