发明名称 |
RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN |
摘要 |
<p>A resist composition comprising organic solvent (S) and, dissolved therein, resin component (A) whose solubility in alkali is changed by the action of an acid and acid generator component (B) which when exposed to light, generates an acid, wherein the organic solvent (S) contains aromatic organic solvent (S1). There is provided a resist composition with LWR reduced, and provided a method of forming a resist pattern therewith.</p> |
申请公布号 |
WO2007015352(A1) |
申请公布日期 |
2007.02.08 |
申请号 |
WO2006JP313710 |
申请日期 |
2006.07.10 |
申请人 |
TOKYO OHKA KOGYO CO., LTD.;WATANABE, RYOJI;SESHIMO, TAKEHIRO;IWAI, TAKESHI |
发明人 |
WATANABE, RYOJI;SESHIMO, TAKEHIRO;IWAI, TAKESHI |
分类号 |
G03F7/039;G03F7/004;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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