发明名称 TRENCH FORMING METHOD, SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To sufficiently retreat a shoulder of a trench, to sufficiently round a corner, to enlarge an opening, to realize a satisfactory embedding characteristic of an insulator with which the trench is filled, to make the trench fine, and to secure current capacity which a MOS transistor requires. <P>SOLUTION: Anisotropic oxidation is performed by using a halogen oxidation method using dichloroethylene (DCE). An anisotropic oxide film 26 is formed where film thickness of the shoulder of the trench 22 is thick, and it gradually becomes thin as it goes to a base. The anisotropic oxide film 26 is removed and the shoulder of the trench is preferentially retreated. The corner is sufficiently rounded and the opening is enlarged. Vicinity of the rounded part of the trench shoulder is used as a channel of the MOS transistor. Thus, channel conductance is enlarged and current capacity of the MOS transistor is increased. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007035823(A) 申请公布日期 2007.02.08
申请号 JP20050215390 申请日期 2005.07.26
申请人 ELPIDA MEMORY INC 发明人 YAMAMOTO HIROHISA
分类号 H01L21/76;H01L21/336;H01L21/822;H01L21/8242;H01L21/8244;H01L21/8247;H01L27/04;H01L27/06;H01L27/108;H01L27/11;H01L27/115;H01L29/78;H01L29/788;H01L29/792 主分类号 H01L21/76
代理机构 代理人
主权项
地址