发明名称 Integrated circuit comprising a test mode secured by detection of the state of a control signal
摘要 An electronic circuit comprises configurable cells driven by command signals to adopt either a standard mode of operation in which they are integrated into a logic circuit, or a test mode in which they provide information on this logic circuit. The circuit includes a spy circuit capable of detecting an abnormal excitation of certain of the conductors through which the command signals travel, thus preventing fraudulent extraction of data out of the configurable cells. The spy circuit includes a logic combination circuit and a state detection cell.
申请公布号 US2007033463(A1) 申请公布日期 2007.02.08
申请号 US20060484359 申请日期 2006.07.10
申请人 STMICROELECTRONICS S.A. 发明人 BANCEL FREDERIC;HELY DAVID
分类号 G01R31/28 主分类号 G01R31/28
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