发明名称 MOS semiconductor devices having polysilicon gate electrodes and high dielectric constant gate dielectric layers and methods of manufacturing such devices
摘要 A semiconductor device includes a substrate divided into an NMOS region and a PMOS region, a first gate pattern formed on the PMOS region, and a second gate pattern formed on the NMOS region. The first gate pattern includes a first gate oxide layer pattern, a metal oxide layer pattern, a silicon nitride layer pattern and a first polysilicon layer pattern that are sequentially stacked. The second gate pattern includes a second oxide layer pattern and a second polysilicon layer pattern. Related methods are also provided.
申请公布号 US2007032008(A1) 申请公布日期 2007.02.08
申请号 US20060494100 申请日期 2006.07.27
申请人 KIM HYE-MIN;SHIN YU-GYUN;JEON IN-SANG;KANG SANG-BOM;PARK HONG-BAE;JIN BEOM-JUN 发明人 KIM HYE-MIN;SHIN YU-GYUN;JEON IN-SANG;KANG SANG-BOM;PARK HONG-BAE;JIN BEOM-JUN
分类号 H01L21/8238 主分类号 H01L21/8238
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