发明名称 METHOD FOR PRODUCING AN AREA HAVING REDUCED ELECTRICAL CONDUCTIVITY WITHIN A SEMICONDUCTOR LAYER AND OPTOELECTRONIC SEMICONDUCTOR ELEMENT
摘要 In a method for producing at least at least one area (8) with reduced electrical conductivity within an electrically conductive III-V semiconductor layer (3), a ZnO layer (1) is applied to the area (8) of the semiconductor layer (3) and subsequently annealed at a temperature preferably between 300° C. and 500° C. The ZnO layer (1) is preferably deposited on the III-V semiconductor layer (3) at a temperature of less than 150° C., preferably at a temperature greater than or equal to 25° C. and less than or equal to 120° C. The area (8) with reduced electrical conductivity is preferably located in a radiation emitting optoelectronic device between the active zone (4) and a connecting contact (7) in order to reduce current injection into the areas of the active zone (4) located opposite to the connecting contact (7).
申请公布号 EP1749317(A1) 申请公布日期 2007.02.07
申请号 EP20050747600 申请日期 2005.04.25
申请人 OSRAM OPTO SEMICONDUCTORS GMBH 发明人 ILLEK, Stefan;STEIN, Wilhelm;WALTER, Robert;WIRTH, Ralph
分类号 H01L21/20;H01L33/02;H01L21/24;H01L21/363;H01L21/76;H01L33/00;H01L33/42 主分类号 H01L21/20
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