发明名称 |
METHOD FOR PRODUCING AN AREA HAVING REDUCED ELECTRICAL CONDUCTIVITY WITHIN A SEMICONDUCTOR LAYER AND OPTOELECTRONIC SEMICONDUCTOR ELEMENT |
摘要 |
In a method for producing at least at least one area (8) with reduced electrical conductivity within an electrically conductive III-V semiconductor layer (3), a ZnO layer (1) is applied to the area (8) of the semiconductor layer (3) and subsequently annealed at a temperature preferably between 300° C. and 500° C. The ZnO layer (1) is preferably deposited on the III-V semiconductor layer (3) at a temperature of less than 150° C., preferably at a temperature greater than or equal to 25° C. and less than or equal to 120° C. The area (8) with reduced electrical conductivity is preferably located in a radiation emitting optoelectronic device between the active zone (4) and a connecting contact (7) in order to reduce current injection into the areas of the active zone (4) located opposite to the connecting contact (7). |
申请公布号 |
EP1749317(A1) |
申请公布日期 |
2007.02.07 |
申请号 |
EP20050747600 |
申请日期 |
2005.04.25 |
申请人 |
OSRAM OPTO SEMICONDUCTORS GMBH |
发明人 |
ILLEK, Stefan;STEIN, Wilhelm;WALTER, Robert;WIRTH, Ralph |
分类号 |
H01L21/20;H01L33/02;H01L21/24;H01L21/363;H01L21/76;H01L33/00;H01L33/42 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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