发明名称 Semiconductor thin film and method of manufacturing the same and semiconductor device and method of manufacturing the same
摘要 A thin film semiconductor transistor structure has a substrate with a dielectric surface, and an active layer made of a semiconductor thin film exhibiting a crystallinity as equivalent to the single-crystalline. To fabricate the transistor, the semiconductor thin film is formed on the substrate, which film includes a mixture of a plurality of crystals which may be columnar crystals and/or capillary crystal substantially parallel to the substrate. The resultant structure is then subject to thermal oxidation in a chosen atmosphere containing halogen, thereby removing away any metallic element as contained in the film. This may enable formation of a mono-domain region in which the individual columnar or capillary crystal is in contact with any adjacent crystals and which is capable of being substantially deemed to be a single-crystalline region without presence or inclusion of any crystal grain boundaries therein. This region is for use in forming the active layer of the transistor.
申请公布号 US7172929(B2) 申请公布日期 2007.02.06
申请号 US20040843613 申请日期 2004.05.12
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;KOYAMA JUN;MIYANAGA AKIHARU;FUKUNAGA TAKESHI
分类号 H01L21/00;G02B27/00;G02B27/01;H01L21/20;H01L21/336;H01L21/77;H01L21/822;H01L21/84;H01L29/04;H01L29/786 主分类号 H01L21/00
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