发明名称 Semiconductor device manufactured by the damascene process having improved stress migration resistance
摘要 A semiconductor device including a second insulating film formed on a substantially flat surface, on which a surface of a first wiring and a surface of a first insulating film are continued, to cover the first wiring, a wiring trench formed in the second insulating film, connection holes formed in the second insulating film to extend from the wiring trench to the first wiring, dummy connection holes formed in the second insulating film to extend from the wiring trench to a non-forming region of the first wiring, and a second wiring buried in the connection holes and the wiring trench to be connected electrically to the first wiring and also buried in the dummy connection holes, and formed such that a surface of the second wiring and a surface of the second insulating film constitute a substantially flat surface.
申请公布号 US7173337(B2) 申请公布日期 2007.02.06
申请号 US20050035745 申请日期 2005.01.18
申请人 FUJITSU LIMITED 发明人 WATANABE KENICHI;SHIMIZU NORIYOSHI;SUZUKI TAKASHI
分类号 H01L23/48;H01L23/52;H01L21/3205;H01L21/768;H01L23/522;H01L23/528 主分类号 H01L23/48
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