发明名称 |
High temperature open ended zero insertion force (ZIF) test socket |
摘要 |
A socket for use in testing packaged integrated circuits having leads depending therefrom includes a first member for receiving the integrated circuit package and having a plurality of holes for receiving leads extending from the package. A second member has a plurality of wire contacts for engaging the leads, the first and second members being arranged to permit relative lateral translation thereof. A support frame includes a first portion which physically engages the first member and a second portion which physically engages the second member. A lever or handle is attached to the second portion and includes a cam surface for engaging a cam follower on the first portion for imparting relative lateral motion between the two members whereby the package leads physically engage wires of the second member.
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申请公布号 |
US7172450(B1) |
申请公布日期 |
2007.02.06 |
申请号 |
US20060306797 |
申请日期 |
2006.01.11 |
申请人 |
QUALITAU, INC. |
发明人 |
SYLVIA ROBERT JAMES;RAMIREZ ADALBERTO M.;ULLMANN JENS;YSAGUIRRE JOSE;CUEVAS PETER P.;EVANS MAURICE C. |
分类号 |
H01R4/50;H01R12/00;H01R13/625;H05K1/00 |
主分类号 |
H01R4/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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