Apparatus for detecting array substrate defect,申请号KR20040061930-传众专利搜索

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发明名称	Apparatus for detecting array substrate defect
摘要
申请公布号	KR100678734(B1)	申请公布日期	2007.02.02
申请号	KR20040061930	申请日期	2004.08.06
申请人		发明人
分类号	G02F1/13	主分类号	G02F1/13
代理机构		代理人
主权项
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