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发明名称
形成层间介电质之方法
摘要
本发明揭示一种用以形成一半导体装置(10)之方法,其包括:提供一半导体基板(12);于该半导体基板之表面上形成一第一应力源层(46);选择性移除该第一应力源层(46)之部份;于该半导体基板以及该第一应力源层之表面上形成一第二应力源层(52);以及运用等向蚀刻选择性移除该第二应力源层之部份。于一项具体实施例中,该等向蚀刻系一湿式蚀刻,其会在不移除大量该第一应力源层(46)之情况下选择性移除该第二应力源层(52),且亦会平坦化该第一应力源层与该第二应力源层间的边界。
申请公布号
TW200705568
申请公布日期
2007.02.01
申请号
TW095120414
申请日期
2006.06.08
申请人
飞思卡尔半导体公司
发明人
保罗A 葛鲁多斯基;史丹利M 菲里派克;金永竹;查德E 温特罗
分类号
H01L21/31(2006.01)
主分类号
H01L21/31(2006.01)
代理机构
代理人
陈长文
主权项
地址
美国
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