发明名称 Ferroelectric random access memory circuits for guarding against operation with out-of-range voltages and methods of operating same
摘要 A method of operating a ferroelectric random access memory (FRAM) can include reading a low-voltage FRAM monitoring memory array and preventing a read/write-back of an FRAM memory cell array if data read from the low-voltage FRAM monitoring memory array is corrupted.
申请公布号 US2007025136(A1) 申请公布日期 2007.02.01
申请号 US20060378726 申请日期 2006.03.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YANG HEE-HYUN
分类号 G11C11/22 主分类号 G11C11/22
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