发明名称 INTEGRATION CONTROL OF INTERCONNECTION AIR CAVITY AND RELIABILITY IMPROVEMENT
摘要 PROBLEM TO BE SOLVED: To provide an integrated circuit, and an integrated circuit manufacturing method, wherein integration of interconnection air cavity is controlled for improved reliability. SOLUTION: The invention relates to an improved integrated circuit and an integrated circuit manufacturing method, in which an air cavity, being highly controlled, is introduced in high speed copper interconnection, based on the introduction of polymer material to the side wall of a via and an interconnection line in an interconnection stack. The method includes controlled formation of air cavity, resulting in improved signal propagation performance at a semiconductor interconnection. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007027734(A) 申请公布日期 2007.02.01
申请号 JP20060191476 申请日期 2006.07.12
申请人 STMICROELECTRONICS (CROLLES 2) SAS;KONINKL PHILIPS ELECTRONICS NV 发明人 TORRES JOAQUIN;GOSSET LAURENT-GEORGES
分类号 H01L21/768;H01L23/522 主分类号 H01L21/768
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