发明名称 METHOD OF FORMING FULL-GERMANIUM SILICIDE-FORMED GATE MOSFET AND DEVICE OBTAINED THEREFROM
摘要 PROBLEM TO BE SOLVED: To provide a method of forming a full-germanium silicide formed gate MOSFET and a device obtained therefrom. SOLUTION: In a MOSFET provided with a full-germanium silicide-formed gate electrode having a high work function, the gate electrode is formed by an auto-aligned reaction step between a silicide-formed metal and a semiconductor material containing silicon and germanium, or is preferably formed by a reaction between nickel and SiGe, and the work function of the gate electrode is finely adjustable. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007027725(A) 申请公布日期 2007.02.01
申请号 JP20060190566 申请日期 2006.07.11
申请人 INTERUNIV MICRO ELECTRONICA CENTRUM VZW 发明人 YU HONGYU;BIESEMANS SERGE
分类号 H01L29/78;H01L21/28;H01L29/423;H01L29/49;H01L29/786 主分类号 H01L29/78
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