发明名称 |
METHOD OF FORMING FULL-GERMANIUM SILICIDE-FORMED GATE MOSFET AND DEVICE OBTAINED THEREFROM |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of forming a full-germanium silicide formed gate MOSFET and a device obtained therefrom. SOLUTION: In a MOSFET provided with a full-germanium silicide-formed gate electrode having a high work function, the gate electrode is formed by an auto-aligned reaction step between a silicide-formed metal and a semiconductor material containing silicon and germanium, or is preferably formed by a reaction between nickel and SiGe, and the work function of the gate electrode is finely adjustable. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007027725(A) |
申请公布日期 |
2007.02.01 |
申请号 |
JP20060190566 |
申请日期 |
2006.07.11 |
申请人 |
INTERUNIV MICRO ELECTRONICA CENTRUM VZW |
发明人 |
YU HONGYU;BIESEMANS SERGE |
分类号 |
H01L29/78;H01L21/28;H01L29/423;H01L29/49;H01L29/786 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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