| 摘要 |
A method of detecting built in test(BIT) data is provided to enhance maintenance efficiency by enabling a user to easily detect defective units of a system consisting of various equipments. A test command is delivered to each device connected to a system(12). A self monitoring command is delivered to a central device, so that the operation states of the central device and lower devices are monitored(13). Self monitoring commands are delivered to the lower devices, so that the operation states of the lower devices are monitored and the monitored results are generated(14,15,16). The sum of the monitoring results of the central and lower devices are collected and a result message is generated(17). Then, operation states of respective devices are delivered to a user(18).
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