SYSTEM, DEVICE, AND METHODS FOR EMBEDDED S-PARAMETER MEASUREMENT
摘要
An embedded s-parameter measurement system for measuring or determining an s-parameter is provided. The system includes an s-parameter test circuit for connecting to a port of a high-frequency multi-port device-under-test (DUT). The s-parameter test circuit includes a directional coupler for sampling a forward signal conveyed to the DUT and for sampling a reverse signal reflected by the DUT. The s-parameter test circuit also includes a peak detector electrically connected to the directional coupler for detecting a magnitude of a signal conveyed to the peak detector by the directional coupler. The s-parameter test circuit further includes a phase detector electrically connected to the directional coupler for determining a phase of a signal conveyed to the phase detector by the directional coupler, and at least one other s-parameter test circuit for connecting to another port of the high-frequency multi-port DUT.
申请公布号
WO2007014280(A2)
申请公布日期
2007.02.01
申请号
WO2006US29048
申请日期
2006.07.25
申请人
UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INC.;EISENSTADT, WILLIAM, R.;FOX, ROBERT, M.;ZHANG, TAO;YOON, JANG, SUP