发明名称 |
OPTICAL INSPECTION DEVICE HAVING LENS UNIT WITH AT LEAST A PAIR OF BEAM PATHS INSIDE, AND METHOD OF DETECTING SURFACE DEFECT OF SUBSTRATE USING SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide an optical inspection device used for detecting the surface defects of a substrate. SOLUTION: The optical inspection device comprises a chuck 53 where the substrate 55 is loaded, and a lens unit 60 positioned on the chuck 53. The lens unit 60 has at least a pair of beam paths inside, and the beam path allows light to go straight. A camera 61 is provided on the lens unit 60, and the camera 61 converts light through the lens unit 60 as an image. A method for detecting the surface defect of the substrate 55 by using the inspection device is also provided. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007024876(A) |
申请公布日期 |
2007.02.01 |
申请号 |
JP20060183734 |
申请日期 |
2006.07.03 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KIM JONG-AN;LEE DONG-CHUN;JUN CHUNGSAM;KIM IK-CHUL;KIM SANG-HEE |
分类号 |
G01N21/956;G02B21/06;H01L21/66 |
主分类号 |
G01N21/956 |
代理机构 |
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