发明名称 TIMING GENERATOR AND SEMICONDUCTOR TEST DEVICE
摘要 <p>It is possible to simplify the configuration of a circuit for controlling a variable delay circuit of a timing generator in real time and assure a timing margin (Eye aperture). The variable delay circuit (10) of the timing generator includes a delay circuit (11) having a plurality of clock buffers (13-1 to 13-n) connected longitudinally; a plurality of data buffers (15-11 to 15-nn) connected longitudinally, and data holding circuits (16-0 to 16-n) for outputting data to the data buffers (15-11 to 15-nn) in accordance with the clock from the delay circuit (11). The delay amount added to the data by the data buffers (15-11 to 15-nn) is made identical to the delay amount added to the clock by the clock buffers (13-1 to 13-n).</p>
申请公布号 WO2007013577(A1) 申请公布日期 2007.02.01
申请号 WO2006JP314953 申请日期 2006.07.28
申请人 ADVANTEST CORPORATION;SUDA, MASAKATSU 发明人 SUDA, MASAKATSU
分类号 G01R31/3183 主分类号 G01R31/3183
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