发明名称 |
Method and apparatus for testing liquid crystal display |
摘要 |
A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.
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申请公布号 |
US2007024315(A1) |
申请公布日期 |
2007.02.01 |
申请号 |
US20060541577 |
申请日期 |
2006.10.03 |
申请人 |
KIM JONG D;LEE HYUN K;CHO YONG J;JEONG SEE H |
发明人 |
KIM JONG D.;LEE HYUN K.;CHO YONG J.;JEONG SEE H. |
分类号 |
G01R31/00;G02F1/13;G09G3/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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