发明名称 Method and apparatus for testing liquid crystal display
摘要 A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.
申请公布号 US2007024315(A1) 申请公布日期 2007.02.01
申请号 US20060541577 申请日期 2006.10.03
申请人 KIM JONG D;LEE HYUN K;CHO YONG J;JEONG SEE H 发明人 KIM JONG D.;LEE HYUN K.;CHO YONG J.;JEONG SEE H.
分类号 G01R31/00;G02F1/13;G09G3/00 主分类号 G01R31/00
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