SEMICONDUCTOR DEVICE, TEST SUBSTRATE, TESTING SYSTEM OF SEMICONDUCTOR DEVICE, AND TESTING METHOD OF SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor device, a test substrate, a testing system of the semiconductor device, and to provide a testing method of the semiconductor device. SOLUTION: The semiconductor device comprises an input terminal into which test pattern data is input in series at a first speed, and an output terminal that corresponds to the input terminal one to one and outputs test pattern data to the outside in series at a second speed different from the first speed. Thus, the cost of the test can be decreased, and reliability related to test efficiency and test result can be improved. COPYRIGHT: (C)2007,JPO&INPIT