发明名称 Semiconductor structure with improved on resistance and breakdown voltage performance
摘要 In one embodiment, a lateral FET cell is formed in a body of semiconductor material. The lateral FET cell includes a super junction structure formed in a drift region between a drain contact and a body region. The super junction structure includes a plurality of spaced apart filled trenches having doped regions of opposite or alternating conductivity types surrounding the trenches.
申请公布号 US2007023855(A1) 申请公布日期 2007.02.01
申请号 US20050193724 申请日期 2005.08.01
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC 发明人 HOSSAIN ZIA;TU SHANGHUI L.
分类号 H01L23/58 主分类号 H01L23/58
代理机构 代理人
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