发明名称 |
MANUFACTURING METHOD OF THIN FILM TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To suppress leakage current when a thin film transistor is turned off even if threshold voltage is not set to be high, and to prevent the deterioration of driving capacity of the thin film transistor. SOLUTION: An amorphous silicon film 2 is crystallized by a heating processing such as laser annealing so as to form a polysilicon film 3. For controlling threshold voltage of the thin film transistor, impurity is ion-implanted into the polysilicon film 3. The polysilicon film 3 is selectively dry-etched or wet-etched so as to form a polysilicon island 3I. The end of the polysilicon island 3I is etched so that it becomes a taper shape with a condition of isotropic etching. COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007027198(A) |
申请公布日期 |
2007.02.01 |
申请号 |
JP20050203278 |
申请日期 |
2005.07.12 |
申请人 |
SANYO EPSON IMAGING DEVICES CORP |
发明人 |
ONOKI TOMOHIDE;SEGAWA YASUO |
分类号 |
H01L29/786;G02F1/1368;H01L21/20;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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