| 摘要 |
PROBLEM TO BE SOLVED: To precisely and quickly regulate the phase of each driver output/comparator input of a testing device. SOLUTION: This testing device for testing a tested device is provided with a pattern generator for generating a test pattern supplied to a terminal of the tested device, a variable delay circuit for delaying the test pattern by a specified time, a driver part connected to the terminal to output a test signal based on the delayed test pattern to the terminal, a storage part for storing regulation value for the delay amount of the variable delay circuit for inputting the test signal into the terminal at assigned output timing, while being correlated with each of a plurality of test conditions, and a delay setting part for acquiring the regulation value, corresponding to the test condition from the storage part to be set in the variable delay circuit, in response to the testing of the device to be tested under any one of the test conditions. COPYRIGHT: (C)2007,JPO&INPIT
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