发明名称 Chemical mechanical polishing apparatus and a method for planarizing/polishing a surface
摘要 The present invention provides a method for planarizing/polishing a surface, a method for manufacturing an integrated circuit and a chemical mechanical polishing apparatus. The method for planarizing/polishing a surface, among other elements, includes providing a chemical mechanical polishing apparatus ( 200, 300, 400 ) having a polishing platen ( 210, 310, 410 ), a carrier head ( 220, 320, 420 ) positioned over the polishing platen ( 210, 310, 410 ), and a slurry delivery source ( 230, 330, 430 ) positioned over and off center the polishing platen ( 210, 310, 410 ), and rotating the polishing platen ( 210, 310, 410 ) in a direction (R<SUB>p2</SUB>, R<SUB>p3</SUB>, R<SUB>p4</SUB>) such that slurry exiting the slurry delivery source ( 230, 330, 430 ) and contacting the polishing platen ( 210, 310, 410 ) must rotate an angle (theta<SUB>2</SUB>, theta<SUB>3</SUB>, theta<SUB>4</SUB>) less than about 220 degrees before contacting a polishable surface maintained by the carrier head ( 220, 320, 420 ).
申请公布号 US2007026769(A1) 申请公布日期 2007.02.01
申请号 US20050191670 申请日期 2005.07.28
申请人 TEXAS INSTRUMENTS, INCORPORATED 发明人 DAVIS EUGENE C.;HUNT KYLE P.;CALDWELL DANIEL R.
分类号 B24B7/30;B24B29/00 主分类号 B24B7/30
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