发明名称 Integrated systems testing
摘要 A system comprises a printed circuit board (PCB). A system on chip (SOC) mounted on the PCB includes a controller that communicates with an external interface that receives test configuration data, transmits test result data, and transmits and receives application data. At least one chip mounted to the PCB, wherein the SOC comprises an SOC component that includes an integrated system test (IST) module. At least one chip comprises a chip component that includes an integrated system test (IST) module. At least one of the SOC component and the chip component, communicates with the controller. At least one of the IST modules is a master IST module that receives the test configuration data and configures the IST modules for testing at least one of the SOC component and the chip component.
申请公布号 US2007024309(A1) 申请公布日期 2007.02.01
申请号 US20050243697 申请日期 2005.10.05
申请人 发明人 AZIMI SAEED;HO SON
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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