发明名称 Cleaning method and polishing apparatus employing such cleaning method
摘要 A method is suitable for cleaning substrates, after polishing, that require a high degree of cleanliness, such as semiconductor wafers, glass substrates, or liquid crystal displays. The method includes polishing a substrate using an abrasive liquid containing abrasive particles, and cleaning a polished surface of the substrate by supplying a cleaning liquid having substantially the same pH as the abrasive liquid or similar pH to the abrasive liquid so that a pH of the abrasive liquid attached to the polished surface of the substrate is not rapidly changed.
申请公布号 US7169235(B2) 申请公布日期 2007.01.30
申请号 US20040844317 申请日期 2004.05.13
申请人 EBARA CORPORATION 发明人 WADA YUTAKA;HIYAMA HIROKUNI;KIMURA NORIO
分类号 C23G1/02;H01L21/304;B08B3/08;B24B53/007;H01L21/00 主分类号 C23G1/02
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